Ron Maltiel Semiconductor Consulting
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Patents Held by Ron Maltiel
Electrical measurements of profile of semiconductor devices during their manufacturing process - #4,978,923
Method and apparatus for non-destructive data in a shadow memory array - #4,716,552
Electrical measurements of properties of semiconductor devices during their manufacturing process - # 4,956,611
Memory cell providing simultaneous non-destructive access to volatile and non-volatile data - #4,672,580
Non-volatile dynamic ram cell - #4,611,309
Gold-doped IC resistor region - #4,432,008
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