Ron Maltiel       Semiconductor Consulting
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Semiconductor Expert Witness Consulting Services, and  Patent Litigation Support

A trial observer stated: "Ron Maltiel was a very competent, authoritative and tough witness"

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Litigation and Infringement Cases at ITC and Federal Courts - Searches and Resources

  • Justia.com - Search Infringements and Litigation.

  • RFC EXpress - Search Intellectual Property Lawsuits.

  • ITC Cases - Search International Trade Commission (ITC) cases using advanced Google government search.
  

Patent Searches and Resources for IP and Litigation Expert Witness

US Patent Office Website  

  • Patent Application File History - Application Data, Transaction History, and Continuity Data
  • View Patent Text and Pictures
  • View Patent Text only
  • Patent Classes -  Listed by Number or Title
  • Download U.S. patents (in PDF) - Free full patent downloads in PDF format.
  • Google Patent Search - Search US Patents, view summary, claim, abstract, drawings, description,  and citations. You can also search inside the patent.
  • FreePatentsOnline.com - Search US Patents, US Patent Applications, and European Patents using Word Stemming, Proximity Searching, Relevancy Ranking, and Search Term Weighting

Other Patent Resources

  • Free European, Japanese, Chinese, and Korean Patents - Download European, French, German and UK Patents; Japanese, Chinese and Korean patents translated and in original language
  • Foreign Patent Office Websites
  • European Patent Office On line
  • Surf related patents - Related patents will be presented for review.
  • Delphion Patent Integrated View  - Analytical tools, data extraction, graphical maps of citation links, etc.
  • Global Database of Companies' Technical Disclosures  - Searchable Data Base of International Prior Art (IP).
  • Process, Device, and Circuit Global Standard and Codes - Searchable Database of Industry Codes and Standards
  • PATWARE PatCitation On line
  • Patent Citation On line  - Data from 65 Patent Offices worldwide, citation relations showing all direct forward and backward cited patent numbers and their bibliographic data in relation to the requested patent number.

copyright 2013 Ron Maltiel all rights reserved