Semiconductor Expert Witness Consulting Services, and  Patent Litigation Support

A trial observer stated: "Ron Maltiel was a very competent, authoritative and tough witness"

---

Litigation and Infringement Cases at ITC and Federal Courts - Searches and Resources

• Justia.com - Search Infringements and Litigation.
  
  
• RFC EXpress - Search Intellectual Property Lawsuits.
  
  
• ITC Cases - Search International Trade Commission (ITC) cases using advanced Google government search.

  

Patent Searches and Resources for IP and Litigation Expert Witness

US Patent Office Website  

• Patent Application File History - Application Data, Transaction History, and Continuity Data
  
• View Patent Text and Pictures
  

• View Patent Text only
  

• Patent Classes -  Listed by Number or Title
  

• Download U.S. patents (in PDF) - Free full patent downloads in PDF format.
  
• Google Patent Search - Search US Patents, view summary, claim, abstract, drawings, description,  and citations. You can also search inside the patent.
  
• FreePatentsOnline.com - Search US Patents, US Patent Applications, and European Patents using Word Stemming, Proximity Searching, Relevancy Ranking, and Search Term Weighting

Other Patent Resources

• Free European, Japanese, Chinese, and Korean Patents - Download European, French, German and UK Patents; Japanese, Chinese and Korean patents translated and in original language
  

• Foreign Patent Office Websites

• European Patent Office On line

• Surf related patents - Related patents will be presented for review.
• Delphion Patent Integrated View  - Analytical tools, data extraction, graphical maps of citation links, etc.
• Global Database of Companies' Technical Disclosures  - Searchable Data Base of International Prior Art (IP).
• Process, Device, and Circuit Global Standard and Codes - Searchable Database of Industry Codes and Standards

• PATWARE PatCitation On line

• Patent Citation On line  - Data from 65 Patent Offices worldwide, citation relations showing all direct forward and backward cited patent numbers and their bibliographic data in relation to the requested patent number.

---